LI-220C

Extended-range 9 kHz to 30 MHz dual-conductor LISN, 20 A per line — extends measurements 16 times lower than standard 1x-series LISNs, the only single-phase Com-Power LISN that captures the 9 kHz to 150 kHz band where modern switching converters now place dominant emissions.

Dual 50 µH + 250 µH air-core network — implements CISPR 16-1-2 V-network plus the ANSI C63.4 250 µH configuration in one unit, supporting both US FCC and international CISPR-based product testing without changing instruments.

Integrated dual-conductor enclosure with universal EUT receptacle and IEC C20 mains input — 270 V_AC / 380 V_DC, 14 A_DC, 50 Ω N-type RF port; insertion loss below 0.5 dB above 15 kHz and isolation above 60 dB above 150 kHz.

LED driver and switching power supply emissions testing below 150 kHz — modern LED drivers and SMPS often operate with switching frequencies of 50–100 kHz, placing fundamental and low-order harmonics in the 9–150 kHz band that 1x-series LISNs cannot characterize.

Smart energy meters and power line communication equipment — products operating in the CENELEC A/B/C/D bands (3–148.5 kHz) for power line communication require LISN coverage starting at 9 kHz per EN 50065 and product family standards.

Solar inverters, EV charging modules, and battery management systems — renewable-energy power conversion equipment with low-frequency switching content; the 9 kHz lower limit is now mandatory for many product family standards covering this category.

Medical devices per IEC 60601-1-2 — medical imaging electronics, patient monitors, and laboratory instruments with sensitive low-frequency conducted emissions characteristics that must be qualified across the 9 kHz–30 MHz extended range.

NIST-traceable individual calibration with three-year warranty — impedance, phase, isolation, and insertion loss data supplied with each unit; ISO 17025 accredited calibration available on request; recommended LIT-153A or LIT-930A transient limiter accessory available separately for additional EMI receiver protection during testing.