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A full range of products that meet a wide range of testing needs | M2 factor testing module compatible with all BeamHere spot analyzers | independently developed and carefully designed analysis software | the software truly achieves interactive friendliness, simplicity and ease of use, with one click output of test reports
Dimension-Labs has launched a series of BeamHere spot analyzers, which are equipped with universal software to achieve complete beam quality analysis functions.
The distribution of spot energy, beam divergence angle, and M ² factor are important components of laser beam quality detection. Efficient and accurate measurement and analysis are prerequisites for fully utilizing lasers. The BeamHere series products have complete functions and can inspect and evaluate scenarios such as beam shaping, focusing spot, and beam collimation. They also provide spot parameters that comply with ISO11146 standards, such as beam width, peak center, and ellipticity. All series products can be equipped with an M ² factor testing module to measure the beam waist position, beam divergence angle, and M ² factor in the direction of beam propagation. BeamHere quantifies the evaluation of laser beams and outputs test reports with one click through software, accurately and efficiently completing beam analysis.
Main Features
① A full range of products that meet a wide range of testing needs
The scanning slit type spot analyzer series and camera type spot analyzer series launched by Dimension-Labs are divided into different applicable bands to form a complete product series, covering a wide range of spot testing needs.
② M ² factor testing module compatible with all BeamHere spot analyzers
The M2 factor testing module launched by Dimension-Labs measures quality evaluation parameters such as M2 factor and beam divergence angle in the direction of beam propagation, and is compatible with scanning slit type spot analyzers and camera type analyzers.
③ Independently developed and carefully designed analysis software
Dimension-Labs' self-developed BeamHere Laser Beam Analyzer software is compatible with all hardware modules in the BeamHere series of beam measurement products. Dimension-Labs strictly controls customer experience, with a clear and concise interface, easy and efficient operation.
④ Innovative, precise, and compact structural design
Dimension-Labs' newly launched scanning slit type spot analyzer has a rotating drum with an adjustment range of ± 90 ° in the vertical laser incident direction, so that the XY axis marked on the front corresponds to the long and short axes of a spot, and outputs more accurate spot simulation and measurement.
At the same time, the structure adopts an adjustable aperture to cover the light passing aperture, with a zero adjustable light passing range, which effectively isolates the interference of ambient light and stray light, protects the light passing aperture and fragile slits, and avoids human touch damage. The adjustment method is also intuitive and convenient.
⑤Dual mode with blade and slit scanning
The scanning slit spot analyzer of different models has two modes of blade and slit scanning, which can be switched independently by software to meet the testing needs of different beam sizes.
⑥ Suitable for complex spot testing with high-order transverse modes
Camera based imaging involves multiple pixels simultaneously providing feedback on the shape of the same spot cross-section at different positions. Therefore, even light spots with irregular energy distribution or non Gaussian distribution containing higher-order transverse modes can be accurately measured by camera based spot analyzers.
⑦ Standard configuration of 6 attenuation pads to meet the needs of extensive power testing
The camera style spot analyzer launched by Dimension-Labs adopts a unique filter wheel structure. Up to 6 different wavelength and attenuation filters can be installed inside the wheel to achieve the maximum power measurement range in the most compact way. Simply rotate the filter to replace it, making it easy to operate and efficient for measurement.
Application scenarios
Beam shaping inspection
Laser beam shaping technology refers to the process of redistributing the irradiance and phase distribution of the incident beam. Whether it is material processing, medical beauty, military fields, or scientific research, the requirements for laser shaping are becoming increasingly high. Therefore, quickly and accurately testing the beam shaping effect is an important driving force for the stability, quality, and efficiency improvement of laser shaping technology.
Beam Collimation
We know that the laser output in the laser resonator usually has a Gaussian distribution in the beam cross-section, and the beam is not collimated in the direction of light propagation. In some applications such as long-distance distance measurement, in order to further improve the accuracy of using laser beams as linear references, we often produce various collimation devices. Measuring the beam size at different positions in the direction of beam propagation using a beam analyzer is a visual means of measuring the collimation effect.
Optical Tweezers System Detection
Zero order Bessel beam, which has ideal infinite transmission distance and self-healing properties. At the same time, it also has the characteristics of highly concentrated transverse plane light intensity, symmetrical strong distribution, concentric circular cross-sectional field, and evenly distributed energy. And these advantages are exactly what optical tweezers technology requires, which can be greatly applied to optical operations and have strong controllability and adaptability in the microscopic world.
Stability Monitoring
In many precision measurement fields, the collimation of lasers and the stability of spatial positions have a significant impact on system testing, seriously increasing measurement errors. When we use various feedbacks to stabilize the system, using a spot analyzer to detect the position in real time and provide a schematic diagram will greatly improve efficiency and reduce research and development costs.
Introduction To Slit Technology
The slit scanner includes a rotating wheel with two pairs of slits of different widths that are perpendicular to each other. There is a rotating motor installed in the rotating wheel, which can control the rotation of the rotating wheel and change the rotation rate. The laser enters from the entrance of the slit scanner, and while the rotating wheel rotates, the vertical slit scans the x and y axes of the laser. While scanning, the photoelectric detector inside the rotating wheel records the power and position information, which can obtain the power levels of the x-axis and y-axis at different positions and times. Process the data to obtain parameters of beam quality such as beam diameter, ellipticity, and center position.
Based on the above measurement principles, the scanning slit type spot analyzer has the following unique advantages:
µm Level Small Beam Measurement
The two pairs of slits with different widths and perpendicular to each other in the scanning slit type spot analyzer correspond to two modes: knife edge and slit scanning. It has unparalleled advantages over other types of analyzers when measuring extremely small light spots with a diameter less than 20 μm. Testing using the knife edge method can reflect the shape of the small light spot.
High Power Measurable Beam
The scanning slit type spot analyzer only allows the light at the slit to pass through and collect the power value each time, and does not receive all the light power at once. This allows the scanning slit type spot analyzer to test high-power lasers of nearly 10W.
0.1 µm ultra-high Resolution
Scanning slit type spot analyzer, based on a unique measurement principle, achieves a resolution of 0 for the spot 1 µm can reflect the spot morphology more clearly and accurately without losing important features.
Interface
Dimension-Labs' self-developed BeamHere Laser Beam Analyzer software has a clear and concise interface, easy and efficient operation, and is compatible with Dimension-Labs' camera based spot analyzer and scanning slit based spot analyzer series products.
Models & Specifications
Slit Type Spot Analyzer
| Model | DL-BH-A-X | DL-BH-500-1700-B | DL-BH-900-2700-B | DL-BH-190-1100-B |
|---|---|---|---|---|
| Wavelength Range (nm) | Tailored | 500~1700 | 900~2700 | 190~1100 |
| Measurement Mode | Slit/Blade | |||
| Slit Size (μm) | 5 | |||
| Knife Edge Dimension (μm) | 25 | |||
| Minimum Beam Diameter (μm) | 2.5 | |||
| Maximum Beam Diameter (mm) | 10 | |||
| Measurable Spot Types | Nearly Gaussian Distribution | |||
| Scanning Rate (Hz) | 2~20 | |||
| Spot Resolution (μm) | 0.1 | |||
| Power Range | 1uW~10W (related to the beam diameter) | |||
| Aperture Size (mm) | 10 | |||
Camera Based Spot Analyzer
| Model | DL-BH-CMOS-400-1100 | DL-BH-CMOS-400-1700 | DL-BH-CMOS-X |
|---|---|---|---|
| Wavelength Range (nm) | 400~1100 | 400~1700 | Tailored |
| Detection Materials | Si | InGaAs | InGaAs |
| Resolution | 2048×2048 | 656×520 | 656×520 |
| Measurement of Beam Diameter | 55um~11mm | 50um~2.5mm | 50um~2.5mm |
| Sensor Types | CMOS | InGaAs | InGaAs |
| Maximum Optical Power (W) | 1 (related to beam diameter) | ||
| Pixel Size (μm) | 5.5 | 5 | 5 |
| Pixel Format (bit) | 8,12 | ||
| Dynamic Range (dB) | 60 | 56 | 56 |
| Shutter | Global shutter | ||
| Shutter Mode | Automatic Exposure/Manual Exposure | ||
| Display | Monochrome/Pseudocolor | ||
| Exposure Time | 30us~1s | 10us~100ms | 10us~100ms |
| Data Interface | USB3.0 | ||
| Dimensions (mm) | 29×29×30 | 29×29×40 | 29×29×40 |
| Model | DL-BH-900-1700-650-JH | DL-BH-CMOS-350-1100 |
|---|---|---|
| Wavelength Range (nm) | 900-1700 | 355-1100 |
| Detection Materials | InGaAs | Si |
| Resolution | 640×512 | 2048×2048 |
| Measurement of Beam Diameter | 150um-7.5mm | 35um-7mm |
| Sensor Types | InGaAs | CMOS |
| Maximum Optical Power (W) | 1 (related to beam diameter) | |
| Pixel Size (μm) | 15 | 3.45 |
| Pixel Format (bit) | 14 | |
| Dynamic Range (dB) | High gain: 58.7; Low gain: 69 | 73.1 |
| Shutter | Global shutter | |
| Shutter Mode | Auto exposure | Automatic Exposure/Manual Exposure |
| Display | Monochrome/Pseudocolor | |
| Data Interface | USB3.0 | |
| Dimensions (mm) | 88.3×66×77.8 | 29×29×30 |
| PC Interface | USB3.0 | |
M² Factor Testing Module
| Model | DL-BH-M2-200 |
|---|---|
| Wavelength Range (nm) | 190~2700 |
| Effective Optical Path Length (mm) | 200 |
| Focal Length (mm) | 100 |
| Lens Dimensions (mm) | 25 |
| Optical Axis Height (mm) | 131 |
| Speed | Adjustable |
| PC Interface | USB2.0 |
Beam Wedge Sampling Attenuation
| Model | DL-LBA-1 | DL-LBA-2 | DL-LBA-2S |
|---|---|---|---|
| Number of Reflective Attenuation Events | 1 | 2 | 2 |
| Mounting Threads | C-mount | C-mount | Through hole |
