Skip to product information

CGX Vacuum High-Low Temperature Semi-Automatic Probe Station


Model

Interested in this product?

Send us your details and we’ll get back to you with availability, pricing, and any additional information you need.

The CGX8 is a semi-automatic 8 inch probe station for measurements in vacuum at high and low temperature. With liquid nitrogen the range is 77 K to 450 K. With liquid helium it is 20 K to 450 K. It is aimed at development and at selected production test, including power devices, MEMS, RF and low-current work.

Key Features

  • Semi-automatic, and it can still be probed by hand
  • Automatic wafer alignment, mapping and die-size measurement
  • Chuck stage speed and a temperature stability better than ±0.1 °C on the series description
  • Four-axis chuck calibration for micrometre pads

Specifications

Specification CGX8
Wafer chuck 8 inch
Control Semi-automatic
Size 1150 × 1450 × 1800 mm
Weight About 1000 kg
Power 220 V AC, 50–60 Hz
Temperature, liquid nitrogen 77 K to 450 K
Temperature, liquid helium 20 K to 450 K
Chuck flatness 20 µm
Probe arm travel, X / Y / Z 10 mm / 10 mm / 10 mm
Probe arm positioning 2 µm
Chuck stage travel, X / Y / Z 200 mm / 200 mm / 20 mm
Chuck stage theta ±5°
Stage repeatability ±1 µm
Controller resolution 0.001 °C
System ultimate pressure < 5.0 × 10⁻⁴ Pa
Leak rate 1.3 × 10⁻⁹ Pa·m³/s

Official product pages do not publish a downloadable datasheet. Contact us for the configuration and a quotation.

Get in touch

We're available 24/7 to assist. Just let us know what we can help you with and we'll do our best.

We'll aim to get back to you within 24 hours.