Semishare

FA Series Failure Analysis Probe Station

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Model

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The FA series is a manual 8 inch station for a failure-analysis laboratory. FA8 is the open station. FA8-SC adds a −80 °C to 200 °C chuck and a quick-pull sample stage. An optional laser, at 1064, 532, 355 or 266 nm, cuts or clears metal and ITO features down to 1 × 1 µm with a 100X lens.

Key Features

  • 8 inch chuck, 360° rotation, 1 µm movement
  • U platen for 10 micropositioners, or an O platen for 12 on FA8-SC
  • Microscope 20X to 4000X
  • Laser micromachining of Cr, Al, ITO, Ni, TFT, poly and similar films
  • Coaxial leakage 1 pA/V, triaxial 100 fA/V, at 25 °C
  • High-voltage and high-current kit is an option

Specifications

Specification FA8 FA8-SC
Wafer 8 inch, 360° rotation 8 inch, 360° rotation
Size (L × W × H) 960 × 850 × 1500 mm 880 × 860 × 1550 mm
Weight About 260 kg About 280 kg
Power 220 V, 50–60 Hz 220 V, 50–60 Hz
XY travel / resolution 8 × 8 inch / 1 µm 8 × 8 inch / 1 µm
Temperature Room temperature −80 °C to 200 °C
Quick stage pull-out No Yes
Platen U shape, up to 10 positioners O shape, up to 12 positioners
Microscope travel XY 2 × 2 inch, Z 50.8 mm XY 1 × 1 inch, Z 50.8 mm
Magnification 20X to 4000X 20X to 4000X
Laser wavelength 1064 / 532 / 355 / 266 nm 1064 / 532 / 355 / 266 nm
Laser output 2.2 mJ/pulse, upgradeable 2.2 mJ/pulse, upgradeable
Smallest laser cut 1 × 1 µm with a 100X lens 1 × 1 µm with a 100X lens
Leakage 1 pA/V coaxial, 100 fA/V triaxial 1 pA/V coaxial, 100 fA/V triaxial

Official product pages do not publish a downloadable datasheet. Contact us for the configuration and a quotation.

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