PS-500

Near field probe set with contact tip, 400 Hz–5 GHz — locates EMI emission sources on PCBs, cables, and enclosures, with added direct-contact circuit measurement.

Four-probe set: H-field loop, broadband E-field, fine-tip E-field, and contact-tip probe — H-field loop 9 kHz–5 GHz, broadband E-field 50 kHz–5 GHz, fine-tip E-field 100 kHz–5 GHz, contact-tip 400 Hz–5 GHz, all in a custom storage case.

Contact-tip probe for direct circuit contact — confirms the exact emission source via direct capacitive coupling to a trace or pin; supports up to 50 VDC on the probed circuit.

Patented fine-tip E-field probe (U.S. Patent #5,132,607) — pinpoints noise on individual IC pins and traces as narrow as 3 mils.

Three-stage workflow — broadband probe finds the hot-spot region, fine-tip probe isolates the trace or pin, and the contact tip confirms the source by direct contact.

H-field loop probe for current-driven emissions — detects magnetic fields from clock signals, serial data, switching power supplies, and transformer leakage.

Extended low-frequency reach (400 Hz) — the contact tip enhances power-integrity investigations beyond the PS-400 range.

BNC (female) interface; optional PAP-501 preamplifier (10 MHz–1000 MHz, 21 dB gain) — connects directly to a 50 Ω spectrum analyzer, EMI receiver, or oscilloscope; no calibrated test facility required.