PS-400

Near field probe set, 9 kHz–5 GHz — locates EMI emission sources on PCBs, cables, and enclosures during pre-compliance debugging and troubleshooting.

Three-probe set: H-field loop, broadband E-field, and fine-tip E-field — H-field loop 9 kHz–5 GHz, broadband E-field 50 kHz–5 GHz, fine-tip E-field 100 kHz–5 GHz, all in a custom storage case.

Patented fine-tip E-field probe (U.S. Patent #5,132,607) — pinpoints noise on individual IC pins and traces as narrow as 3 mils.

Two-stage workflow — the broadband stub probe finds the general hot-spot region, then the fine-tip probe isolates the exact radiating trace or pin.

H-field loop probe for current-driven emissions — detects magnetic fields from clock signals, serial data, switching power supplies, and transformer leakage.

Enclosure leakage detection — scans seams, ventilation slots, and cable entry points to reveal slot-antenna effects and poor bonding.

Design debugging support — helps diagnose impedance mismatch, transmission-line reflections, via discontinuities, and stub effects.

BNC (female) interface; optional PAP-501 preamplifier (10 MHz–1000 MHz, 21 dB gain) — connects directly to a 50 Ω spectrum analyzer or EMI receiver; no calibrated test facility required.